Application Notes

Ophthalmic Surgery

Application Notes

The laser is particularly suited to ophthalmic surgery since it can provide a non-contact method of interacting with the cornea or even the interior of the eye, including the lens and the retina.

Super-Resolution Microscopy

Application Notes

One super-resolution approach is called stimulated emission depletion (STED) microscopy. This technique uses a confocal microscope and a diffraction limited excitation beam that is scanned across the sample.

LiDAR

Application Notes

LiDAR is an active remote sensing technique that is similar to RADAR but, instead of using radio waves as a radiation source, it uses laser pulses. In this technique, a laser source emits pulses that are directed towards the target of interest.

Flat Panel Display Manufacturing

Application Notes

As the flat panel display market moves from LCD to OLED display technology, laser patterning and cutting of heterogeneous materials (comprised of multiple organic material films) with high quality and accuracy is needed.

PCB Manufacturing

Application Notes

Lasers are routinely used in a variety of PCB manufacturing processes including via drilling, depaneling, profiling, laser direct imaging, repair, trimming, and marking. Laser processing completely eliminates mechanical stress on the material.

Solar Panel Manufacturing

Application Notes

Crystalline-Silicon solar cells are the predominant solar cell technology used in fabricating solar panels because of the availability of silicon, well-developed manufacturing processes, and the high conversion efficiencies that can be achieved.

Unpatterned Wafer Inspection

Application Notes

Modern unpatterned wafer inspection tools detect particles and pattern defects and determine the position of these defects in an X-Y grid on the wafer which can be output to the user for diagnostic purposes.

Reticle Inspection

Application Notes

Reticle inspection systems work on the same principles and have similar physical requirements as wafer inspection tools, with the exception that reticles are normally inspected using transmitted rather than reflected light.

Patterned Wafer Inspection

Application Notes

Optical inspection of patterned wafers can employ bright-field, dark-field illumination or a combination of both for defect detection. Additionally, electron beam (EB) imaging is also used for defect inspection.

Introduction to Laser Frequency Stabilization

Application Notes

The steps outlined in this application note can be used to stabilize a TLB-7000, TLB-6900, or TLB-6300 series tunable diode laser to a reference cavity using the Pound-Drever-Hall stabilization technique.
Page 1 of 13