Page view updated with the selected options.

Literature

Showing 1 - 12 of 12 Literature
undefined
Literature

A Standard for Measuring Transient Suppression of Laser Diode Drivers - White Paper

Semiconductor lasers are sensitive to transient voltage or current pulses. A transient of relatively large amplitude can damage a semiconductor laser. Protection from these transients ...
undefined
Literature

Automating Precise Engineering Processes - White Paper

The chip attach process is fundamental to laser-diode device performance. Key parameters for assembly and higher yields can result from exact measurements and carefully cinstructed ...
undefined
Literature

Degree of Polarization vs. Poincare Sphere Coverage - White Paper

High speed and low degree of polarization (DOP) are frequently considered critical specifications when choosing a polarization scrambler. High-speed scramblers allow faster measurement ...
undefined
Literature

Calibration and Traceability Ensure Measurement Accuracy - White Paper

High quality power meters provide measurement assurance through a two-step system: calibration of the photodetector and the electronic gain of the stages.
undefined
Literature

Laser Diode Burn-In and Reliability Testing - White Paper

Over 99% of all lasers manufactured in the world today are semiconductor laser diodes. Reliability is a concern in every laser diode application whether it is a simple $10 laser pointer ...
undefined
Literature

Improving Splice Loss Measurement Repeatability - White Paper

Splice loss testing requires the measurement of the optical power output from a freshly cleaved fiber prior to fusion splicing. This testing is performed during the manufacture of numerous ...
undefined
Literature

Power Supplies - Performance Factors Characterize High Power Laser Diode Drivers - White Paper

The need to drive progressively higher-power diode-pumped solid-state lasers, laser-diode bars, and laser-diode stacks has driven system developers to seek quality laser-diode power ...
undefined
Literature

Simplifying Parametric Analysis of Laser Diodes - White Paper

L/I/V testing is universally regarded as the basic testing methodology for laser diodes, since many significant optoelectronic parameters can be measured or derived from the test r ...
undefined
Literature

Reducing the Cost of Test in Laser Diode Manufacturing - White Paper

Today’s optoelectronic component manufacturers face significant pressures to reduce price, shorten time to market, and respond quickly to specialized customer requirements. As product ...
undefined
Literature

Reliability Counts for Laser Diodes - White Paper

The commercial success of a laser supplier rests largely on its ability to develop a robust manufacturing process that consistently produces reliable devices.
undefined
Literature

PRS-9330 Photodiode Test System Brochure

The PRS-9330 is a high density photodiode burn-in and life-test system capable of testing a maximum of 1408 devices simultaneously.
undefined
Literature

ILX Lightwave Instruments 2021 Product Selection Guide

For over thirty years, ILX Lightwave has been a pioneer in laser diode instrumentation and test systems, starting with the industry’s first precision laser diode current source in 1986. ...